In situ spectroscopic measurement of structural change in SiO2 during femtosecond laser irradiation

Applied Physics A: Materials Science and Processing

Volumn 79, Issue 4-6, 2004, Pages 1425-1427

  Fukata, N ^a   Yamamoto, Y ^a   Murakami, K ^a   Hase, M ^b   Kitajima, M ^a,b  

^a UNIVERSITY OF TSUKUBA   (Japan)

^b NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION; CORRELATION METHODS; EXCITONS; LASER BEAM EFFECTS; LASER PULSES; LIGHT ABSORPTION; LIGHT TRANSMISSION; PARAMAGNETIC RESONANCE; PHOTOLUMINESCENCE; SPECTROSCOPIC ANALYSIS;

DENSITY RATIOS; OXYGEN DEFICIENCY CENTERS (ODC); SELF TRAPPED EXCITONS (STE); STRUCTURAL CHANGES;

SILICA;

EID: 4344667424     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00339-004-2802-z     Document Type: Conference Paper

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