Bi-enhanced heteroepitaxial layered growth of Cr on Fe(100)-c(2×2)O reconstruction surfaces

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 43, Issue 6 A, 2004, Pages 3561-3565

  Kamiko, Masao ^a   Mizuno, Hiroyuki ^a   Chihaya, Hiroaki ^a   Xu, Junhua ^b   Kojima, Isao ^b   Yamamoto, Ryoichi ^a  

^a INSTITUTE OF INDUSTRIAL SCIENCE   (Japan)

^b NATIONAL INSTITUTE OF ADVANCED INDUSTRIAL SCIENCE AND TECHNOLOGY AIST   (Japan)

Author keywords

AES; AFM; Bi; Cr; MBE; RHEED; Surface segregation; Surface structure; Surfactant

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; AUGER ELECTRON SPECTROSCOPY; BISMUTH; CHROMIUM; EPITAXIAL GROWTH; GIANT MAGNETORESISTANCE; IRON; MOLECULAR BEAM EPITAXY; MULTILAYERS; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; SEGREGATION (METALLOGRAPHY); SINGLE CRYSTALS; SURFACE ACTIVE AGENTS;

HETEROEPITAXIAL EFFECTS; METALLIC MULTILAYERS; SEGREGATION EFFECTS; SURFACE SEGREGATION;

THIN FILMS;

EID: 4344662392     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/JJAP.43.3561     Document Type: Article

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