Application of the 2D/3D MICHELLE code to electron gun and collector modeling

4th IEEE International Vacuum Electronics Conference, IVEC 2003 - Proceedings

Volumn , Issue , 2003, Pages 10-11

  Petillo, J ^a   Eppley, K ^a   Panagos, D ^a   Nelson, E ^b   Dionne, N ^c   Deford, J ^c   Held, B ^c   Chemyakova, L ^c   Burdette, J ^d   Zhai, X ^d   Cattelino, M ^c   Nguyen, K ^e   Levush, B ^c  

^a SCIENCE APPLICATIONS INTERNATIONAL CORPORATION   (United States)

^b LOS ALAMOS NATIONAL LABORATORY   (United States)

^c LANL ^*  (United States)

^d BOEING COMPANY   (United States)

^e KN Research   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGED PARTICLES; CODES (SYMBOLS); ELECTRON GUNS; ELECTROSTATIC DEVICES; ION SOURCES; MESH GENERATION; VACUUM TECHNOLOGY;

CHARGED PARTICLE TRANSPORT; DEPRESSED COLLECTOR; DEVELOPMENT PROGRAMS; FINITE ELEMENT TECHNIQUES; PARTICLE-IN-CELL CODE; THREEDIMENSIONAL (3-D); UNSTRUCTURED MESHES; VACUUM ELECTRON DEVICES;

FINITE ELEMENT METHOD;

EID: 4344659908     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/IVEC.2003.1285997     Document Type: Conference Paper

References (0)