Temperature-dependent third cumulant of tunneling noise

Physical Review Letters

Volumn 90, Issue 17, 2003, Pages

  Beenakker, C W J ^a   Kindermann, M ^a   Nazarov, Yu V ^b  

^a UNIVERSITEIT LEIDEN   (Netherlands)

^b DELFT UNIVERSITY OF TECHNOLOGY   (Netherlands)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC CURRENTS; ELECTRIC POTENTIAL; ELECTRON SCATTERING; ELECTRON TUNNELING; NUMERICAL METHODS; PHONONS; RESISTORS; SHOT NOISE; STATISTICS; THERMAL EFFECTS;

LANGEVIN APPROACH; POISSON STATISTICS; TEMPERATURE DEPENDENCE; TEMPERATURE DEPENDENT THIRD CUMULANT; TUNNELING NOISE;

TUNNEL JUNCTIONS;

EID: 4344657512     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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