New developments in X-ray storage phosphors

Radiation Measurements

Volumn 38, Issue 4-6, 2004, Pages 633-638

  Schweizer, S ^a,b   Secu, M ^a   Spaeth, J M ^a   Hobbs, L W ^b   Edgar, A ^c   Williams, G V M ^c,d  

^a UNIVERSITY OF PADERBORN   (Germany)

^b Massachusetts Institute of Technology Cambridge   (United States)

^c VICTORIA UNIVERSITY OF WELLINGTON   (New Zealand)

^d CALLAGHAN INNOVATION   (New Zealand)

Author keywords

Fluorozirconate glass ceramics; Photostimulated luminescence; X ray storage phosphor

Indexed keywords

ANNEALING; ELECTRONS; GLASS CERAMICS; HOLE TRAPS; IONS; IRRADIATION; LUMINESCENCE; PARTICLE SIZE ANALYSIS; PHOTOGRAPHIC FILMS; RAYLEIGH SCATTERING; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION ANALYSIS;

FLUOROZIRCONATE GLASS-CERAMICS; PHOTOSTIMULATED LUMINESCENCE (PSL); X-IRRADIATION; X-RAY STORAGE PHOSPHOR;

PHOSPHORS;

EID: 4344648354     PISSN: 13504487     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.radmeas.2003.12.025     Document Type: Conference Paper

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