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Volumn 14, Issue 2, 2004, Pages 1237-1240
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Identification of aging mechanisms for non-destructive pulsed magnets operating in the 60 T Range
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Author keywords
Coper stainless steel conductors; Cryogenic deformation; Electrical and mechanical aging; Pulsed magnets
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Indexed keywords
AGING OF MATERIALS;
CAPACITANCE;
CRYOGENICS;
ELECTRIC ARCS;
ELECTRIC CONDUCTIVITY;
ELECTRIC FIELDS;
MICROHARDNESS;
NONDESTRUCTIVE EXAMINATION;
OPTIMIZATION;
PLASTIC DEFORMATION;
STRAIN;
THERMAL STRESS;
TRANSMISSION ELECTRON MICROSCOPY;
COPPER-STAINLESS STEEL CONDUCTORS;
CRYOGENIC FORMATION;
ELECTRICAL AND MECHANICAL AGING;
PULSED MAGNETS;
MAGNETS;
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EID: 4344646405
PISSN: 10518223
EISSN: None
Source Type: Journal
DOI: 10.1109/TASC.2004.830540 Document Type: Conference Paper |
Times cited : (8)
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References (10)
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