AgAsS2 amorphous chalcogenide films prepared by pulsed laser deposition

Applied Physics A: Materials Science and Processing

Volumn 79, Issue 4-6, 2004, Pages 1563-1565

  Wagner, T ^a   Krbal, M ^a   Nemec, P ^a   Frumar, M ^a   Wagner, Th ^b   Vlcek, Mil ^a   Perina, V ^c   Mackova, A ^c   Hnatovitz, V ^d   Kasap, S O ^d  

^a UNIVERSITY OF PARDUBICE   (Czech Republic)

^b LOT Oriel GmbH   (Germany)

^c NUCLEAR PHYSICS INSTITUTE   (Czech Republic)

^d UNIVERSITY OF SASKATCHEWAN   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

ELLIPSOMETRY; ENERGY DISPERSIVE SPECTROSCOPY; EXCIMER LASERS; LASER ABLATION; LASER BEAM EFFECTS; MICROANALYSIS; PULSED LASER DEPOSITION; REFRACTIVE INDEX; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SUBSTRATES; VACUUM; X RAY ANALYSIS;

AMORPHOUS CHALCOGENIDE FILMS; BULK TERNARY GLASS; DEPOLARIZATION; ELASTIC RECOIL DETECTION ANALYSIS (ERDA);

AMORPHOUS FILMS;

EID: 4344645383     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00339-004-2848-y     Document Type: Conference Paper

References (7)

1. A. V. Kolobov, K. Tanaka: Handbook of Advanced Electronic and Photonic Materials (Academic, Tokyo 2000)
2. T. Wagner, G. Dale, P.J.S. Ewen, A.E. Owen, V. Perina: J. Appl. Phys. 87, 7758 (2000)
3. T. Wagner: J. Optoelectron. Adv. Mater. 4, 717 (2002)
4. J. Saarilahti, E. Rauhala: Nucl. Instrum. Methods B 64, 734 (1992)
5. M. Mayer: Simnra Users Guide (Institute for Plasmaphysik, Garching Germany 1998)
6. H.G. Tompkins, W.A. McGahan: Spectroscopic Ellipsometry and Reflectometry (Wiley, New York 1999) p. 147
7. R. Swanepoel: J. Phys. E: Sci. Instrum. 16, 1214 (1983)