Amorphous chalcogenide AgSbS2 films prepared by pulsed laser deposition

Applied Physics A: Materials Science and Processing

Volumn 79, Issue 4-6, 2004, Pages 1561-1562

  Wagner, T ^a,b   Gutwirth, J ^a   Nemec, P ^a   Frumar, M ^a   Vlcek, M ^a   Perina, V ^c   Mackova, A ^c   Hnatovitz, V ^c  

^a UNIVERSITY OF PARDUBICE   (Czech Republic)

^b LOT Oriel GmbH   (Germany)

^c NUCLEAR PHYSICS INSTITUTE   (Czech Republic)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; ELLIPSOMETRY; ENERGY DISPERSIVE SPECTROSCOPY; GLASS; LASER BEAM EFFECTS; OPTICAL RECORDING; PULSED LASER DEPOSITION; REFRACTIVE INDEX; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SUBSTRATES; SURFACE ROUGHNESS; VACUUM; X RAY ANALYSIS;

AMORPHOUS CHALCOGENIDES; BULK GLASS; DEPOLARIZATION; ELASTIC RECOIL DETECTION ANALYSIS (ERDA);

AMORPHOUS FILMS;

EID: 4344627248     PISSN: 09478396     EISSN: None     Source Type: Journal    
DOI: 10.1007/s00339-004-2847-z     Document Type: Conference Paper

References (9)

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