Transmission-electron-microscopy study on fivefold twinned silver nanorods

Journal of Physical Chemistry B

Volumn 108, Issue 32, 2004, Pages 12038-12043

  Chen, Hanyuan ^a   Gao, Yan ^a   Zhang, Huairou ^a   Liu, Libao ^a   Yu, Hongchun ^a   Tian, Huanfang ^a   Xie, Sishen ^a   Li, Jianqi ^a  

^a INSTITUTE OF PHYSICS   (China)

Author keywords

[No Author keywords available]

Indexed keywords

CARRIER CONCENTRATION; CRYSTALLOGRAPHY; ELECTRON DIFFRACTION; ELECTRON ENERGY LOSS SPECTROSCOPY; FAST FOURIER TRANSFORMS; HIGH RESOLUTION ELECTRON MICROSCOPY; MICROSTRUCTURE; TRANSMISSION ELECTRON MICROSCOPY; TWINNING;

HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY (HRTEM); NANORODS; SELECTED AREA ELECTRON DIFFRACTION (SAED); TWINNING BOUNDARIES;

NANOSTRUCTURED MATERIALS;

EID: 4344623984     PISSN: 15206106     EISSN: None     Source Type: Journal    
DOI: 10.1021/jp048023d     Document Type: Article

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