An SOC compatible linearity test approach for precision ADCs using easy-to-generate sinusoidal stimuli

Proceedings - IEEE International Symposium on Circuits and Systems

Volumn 1, Issue , 2004, Pages

  Jin, Le ^a   He, Chengming ^a   Chen, Degang ^a   Geiger, Randall ^a  

^a Iowa State University of Science and Technology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ALGORITHMS; COMPUTATIONAL COMPLEXITY; COMPUTER SIMULATION; COST EFFECTIVENESS; INTEGRATED CIRCUITS; MICROPROCESSOR CHIPS; MIXER CIRCUITS; SIGNAL GENERATORS; SIGNAL INTERFERENCE;

ANALOG AND MIXED SIGNALS (AMS); CIRCUIT DESIGN; DEVICE UNDER TEST (DUT); SYSTEM ON A CHIP (SOC);

ANALOG TO DIGITAL CONVERSION;

EID: 4344614507     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (11)

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