Structure analysis of Cu(0 0 1)-c(4 × 4)-In by surface X-ray diffraction

Surface Science

Volumn 565, Issue 2-3, 2004, Pages 144-150

  Hatta, S ^a   Walker, C J ^b   Sakata, O ^b   Okuyama, H ^a   Aruga, T ^a  

^a KYOTO UNIVERSITY   (Japan)

^b JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

Author keywords

Copper; Indium; Surface structure, morphology, roughness, and topography; X ray scattering, diffraction, and reflection

Indexed keywords

BRILLOUIN SCATTERING; INDIUM; LOW ENERGY ELECTRON DIFFRACTION; PHASE TRANSITIONS; SCANNING TUNNELING MICROSCOPY; STRUCTURAL ANALYSIS; SUBSTRATES; SURFACE ROUGHNESS; SURFACE STRUCTURE; TRANSITION METALS; X RAY DIFFRACTION; X RAY SCATTERING;

CHARGE-DENSITY-WAVE (CDW); ROUGHNESS AND TOPOGRAPHY; ULTRAHIGH VACUUM (UHV); X-RAY REFLECTION;

COPPER;

EID: 4344610144     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2004.06.216     Document Type: Article

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