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Volumn 198-200, Issue , 2002, Pages 415-423
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Automatic film formation system for ultra-thin organic/inorganic hetero-structure by mass-controlled layer-by-layer sequential adsorption method with 'nm' scale accuracy
a
a
KEIO UNIVERSITY
(Japan)
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Author keywords
Layer by layer; Mass control; Quartz crystal microbalance; Sequential adsorption; Thin film
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Indexed keywords
ADSORPTION;
ATOMIC FORCE MICROSCOPY;
HETEROJUNCTIONS;
INTERFACES (MATERIALS);
MONOMERS;
POLYELECTROLYTES;
SOLUTIONS;
WATER;
QUARTZ CRYSTAL MICROBALANCE (QCM);
ULTRATHIN FILMS;
MONOMER;
ORGANIC COMPOUND;
POLYELECTROLYTE;
POLYMER;
VOLATILE AGENT;
WATER;
ACCURACY;
ADSORPTION;
ATOMIC FORCE MICROSCOPY;
CHEMICAL STRUCTURE;
CONFERENCE PAPER;
CRYSTAL;
FILM;
PRIORITY JOURNAL;
THICKNESS;
TRANSMISSION ELECTRON MICROSCOPY;
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EID: 4344603900
PISSN: 09277757
EISSN: None
Source Type: Journal
DOI: 10.1016/S0927-7757(01)00953-0 Document Type: Conference Paper |
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Times cited : (29)
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References (10)
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