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Volumn 63, Issue 9, 2001, Pages

Magnetoresistance of insulating amorphous NixSi1-x films exhibiting Mott variable-range hopping laws

Author keywords

[No Author keywords available]

Indexed keywords

HELIUM; METAL COMPLEX; NICKEL COMPLEX; SILICON DERIVATIVE;

EID: 4344603295     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.63.094426     Document Type: Article
Times cited : (50)

References (31)
  • 16
    • 0000047142 scopus 로고
    • Sov. Phys. Semicond. 17, 1311 (1983)
    • B. I. Shklovskii, Fiz. Tekh. Poluprovodn. 17, 2055 (1983) [Sov. Phys. Semicond. 17, 1311 (1983)].
    • (1983) Fiz. Tekh. Poluprovodn , vol.17 , pp. 2055
    • Shklovskii, B.I.1
  • 19
    • 33744670847 scopus 로고
    • Sov. Phys. Semicond. 15, 1378 (1981)
    • A. S. Ioselevich, Fiz. Tekh. Poluprovodn. 15, 2373 (1981) [Sov. Phys. Semicond. 15, 1378 (1981)].
    • (1981) Fiz. Tekh. Poluprovodn , vol.15 , pp. 2373
    • Ioselevich, A.S.1
  • 30
    • 85039005920 scopus 로고    scopus 로고
    • private communication
    • U. Sivan (private communication).
    • Sivan, U.1


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.