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Volumn 71, Issue 3-4, 2004, Pages 741-742
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Apparatus for X-ray diffraction analysis at high pressures
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Author keywords
[No Author keywords available]
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Indexed keywords
ANALYTIC METHOD;
APPARATUS;
CONFERENCE PAPER;
HYPERBARISM;
MEASUREMENT;
SCINTISCANNING;
SYNCHROTRON RADIATION;
X RAY DIFFRACTION;
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EID: 4344598966
PISSN: 0969806X
EISSN: None
Source Type: Journal
DOI: 10.1016/j.radphyschem.2004.04.085 Document Type: Conference Paper |
Times cited : (3)
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References (2)
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