Detection of nanometer displacement in optical-tweezers and its related measuring errors

Zhongguo Jiguang/Chinese Journal of Lasers

Volumn 31, Issue 6, 2004, Pages 729-734

  Chen, Hong Tao ^a   Li, Yin Mei ^a   Lou, Li Ren ^a   Sun, Li ^a   Zhang, Da ^a   Gong, Zhan ^a  

^a UNIVERSITY OF SCIENCE AND TECHNOLOGY OF CHINA   (China)

Author keywords

Data processing methods; Measuring error; Nanometer displacement; Optical tweezers; Optoelectronics; Pico Newton force

Indexed keywords

COMPUTER SIMULATION; DATA PROCESSING; ERROR DETECTION; IMAGE ANALYSIS; MEASUREMENT ERRORS;

DYNAMIC IMAGE ANALYSIS; MEASURING ERROR; NANOMETER DISPLACEMENT; OPTICAL TWEEZERS; PICO NEWTON FORCE; QUADRANT DETECT METHOD;

OPTOELECTRONIC DEVICES;

EID: 4344595864     PISSN: 02587025     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

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