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Journal of Materials Science: Materials in Electronics

Volumn 15, Issue 10, 2004, Pages 699-701

Characterization and dielectric properties of Sr4La2Ti4M6O30 (M=Nb, Ta) ceramics

(4) Fang, Liang a,b Zhang, Hui a,b Yuan, R Z a Dronskowski, Richard b

a WUHAN UNIVERSITY OF TECHNOLOGY (China)

b RWTH AACHEN UNIVERSITY (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; CAPACITORS; CHARACTERIZATION; COMPACTION; DIELECTRIC LOSSES; DIELECTRIC PROPERTIES OF SOLIDS; PERMITTIVITY; SCANNING ELECTRON MICROSCOPY; SINTERING; STRONTIUM COMPOUNDS; SYNTHESIS (CHEMICAL); X RAY POWDER DIFFRACTION;

HIGH TEMPERATURE SOLID STATE REACTION TECHNIQUE; PARAELECTRIC PHASES; QUATERNARY SYSTEM; TUNGSTEN-BRONZE STRUCTURE;

CERAMIC MATERIALS;

EID: 4344594460 PISSN: 09574522 EISSN: None Source Type: Journal
DOI: 10.1023/B:JMSE.0000038926.83018.df Document Type: Article

Times cited : (13)

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