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Volumn 5, Issue , 2004, Pages

Optimization design of the Dickson charge pump circuit with a resistive load

Author keywords

[No Author keywords available]

Indexed keywords

CAPACITANCE; ELECTRIC CHARGE; ELECTRIC CONDUCTIVITY; ELECTRIC LOADS; ELECTRIC POTENTIAL; OPTIMIZATION;

EID: 4344591444     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (13)

References (10)
  • 2
    • 0035307510 scopus 로고    scopus 로고
    • Multi-value voltage-to-voltage converter using a multi-stage symmetrical charge pump for on-chip EEPROM programming
    • April
    • M. Zhang, N. Llaser and F. Devos, "Multi-value Voltage-to-voltage Converter Using a Multi-stage Symmetrical Charge Pump for on-chip EEPROM Programming", Analog Integrated Circuits and Signal Processing, Vol.27, pp. 85-95, April, 2001.
    • (2001) Analog Integrated Circuits and Signal Processing , vol.27 , pp. 85-95
    • Zhang, M.1    Llaser, N.2    Devos, F.3
  • 4
    • 0016961262 scopus 로고
    • On-Chip high-voltage generation in NMOS integrated circuits using an improved voltage multiplier techniques
    • June
    • J. F. Dickson, "On-Chip high-voltage generation in NMOS integrated circuits using an improved voltage multiplier techniques", IEEE J. Solid-state Circuits, Vol. 11, pp. 374-378, June, 1976.
    • (1976) IEEE J. Solid-state Circuits , vol.11 , pp. 374-378
    • Dickson, J.F.1
  • 5
    • 0001050518 scopus 로고    scopus 로고
    • MOS charge pumps for low voltage operation
    • April
    • Jieh-Tsorng Wu and Kuen-Long Chang, "MOS charge pumps for low voltage operation", IEEE J. Solid-state Circuits, Vol. 33, No. 4, April, pp. 592-597, 1998.
    • (1998) IEEE J. Solid-state Circuits , vol.33 , Issue.4 , pp. 592-597
    • Wu, J.-T.1    Chang, K.-L.2
  • 6
    • 4344629422 scopus 로고    scopus 로고
    • A new charge pump without degradation in threshold voltage due to body effect
    • April
    • Jongshin Shin, In-Young, Young June Park, and Hong Shick Min, "A New Charge Pump Without Degradation in Threshold Voltage Due to Body Effect", IEEE J. Solid-state Circuits, Vol. 33, No. 4, April, pp. 592-597, 1998.
    • (1998) IEEE J. Solid-state Circuits , vol.33 , Issue.4 , pp. 592-597
    • Shin, J.1    In-Young, Y.2    Park, J.3    Min, H.S.4
  • 7
    • 0031210141 scopus 로고    scopus 로고
    • A dynamic analysis of the Dickson charge pump circuit
    • August
    • T. Tanzawa and T. Tanaka, "A Dynamic Analysis of the Dickson Charge Pump Circuit", IEEE J. Solid-state Circuits, Vol. 32, No. 8, pp. 1231-1240, August, 1997.
    • (1997) IEEE J. Solid-state Circuits , vol.32 , Issue.8 , pp. 1231-1240
    • Tanzawa, T.1    Tanaka, T.2
  • 9
    • 0030147534 scopus 로고    scopus 로고
    • Design of an Nth order Dickson voltage multiplier
    • may
    • G. Di Cataldo and G. Palumbo, "Design of an Nth Order Dickson Voltage Multiplier", IEEE Transactions on Circuits and Systems, Vol. 43, no.5 pp. 414-418, may, 1996.
    • (1996) IEEE Transactions on Circuits and Systems , vol.43 , Issue.5 , pp. 414-418
    • Di Cataldo, G.1    Palumbo, G.2
  • 10
    • 77956015382 scopus 로고    scopus 로고
    • A dynamic analysis of Dickson charge pump circuits with a resistive load
    • Sharjah, United Arab Emirates, Dec. 14-17
    • M. Zhang, and N. Llaser, "A dynamic analysis of Dickson charge pump circuits with a resistive load", IEEE Int. Conf. Electronics, Circuits and Systems, Sharjah, United Arab Emirates, Dec. 14-17, 2003.
    • (2003) IEEE Int. Conf. Electronics, Circuits and Systems
    • Zhang, M.1    Llaser, N.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.