Measurements of mass attenuation coefficients around the K absorption edge of semiconductors by parametric X-rays

Radiation Physics and Chemistry

Volumn 71, Issue 3-4, 2004, Pages 643-645

  Akimoto, Tadashi ^a   Yoshida, Tsuyoshi ^a   Nakamura, Ryousuke ^a   Sato, Kouichi ^a   Murai, Ikuo ^a   Fujita, Fumiyuki ^a  

^a HOKKAIDO UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ARSENIC; GALLIUM; GERMANIUM;

COLLIMATOR; CONFERENCE PAPER; DIODE; ELECTRON; LINEAR ACCELERATOR; MASS; MEASUREMENT; RADIATION ABSORPTION; SEMICONDUCTOR; X RAY;

EID: 4344589937     PISSN: 0969806X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.radphyschem.2004.04.037     Document Type: Conference Paper

References (2)

1. Akimoto T., et al. Generation and use of parametric X-rays with an electron linear accelerator. Nucl. Instrum. Methods A. 459:2001;78-86
2. Schagin A.V., et al. Differential properties of parametric X-ray radiation from thin crystal. Nucl. Instrum. Methods. B119:1996;115-122