Interaction between metals and organic semiconductors studied by Raman spectroscopy

Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films

Volumn 22, Issue 4, 2004, Pages 1482-1487

  Zahn, Dietrich R T ^a   Salvan, Georgeta ^a   Paez, Beynor A ^a   Scholz, Reinhard ^a  

^a CHEMNITZ UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

BASE PRESSURE; ENHANCEMENT FACTORS; LOW ENERGY BANDS; SPECTRAL REGIONS;

CHEMICAL BONDS; DERIVATIVES; DIFFUSION; MOLECULAR STRUCTURE; MORPHOLOGY; PASSIVATION; RAMAN SPECTROSCOPY; SEMICONDUCTING ORGANIC COMPOUNDS;

THIN FILMS;

EID: 4344583457     PISSN: 07342101     EISSN: None     Source Type: Journal    
DOI: 10.1116/1.1752897     Document Type: Conference Paper

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