Micro-Raman study of orientation effects of CuxSe-crystallites on Cu-rich CuGaSe2 thin films

Journal of Applied Physics

Volumn 96, Issue 4, 2004, Pages 1963-1966

  Xue, C ^a   Papadimitriou, D ^a   Raptis, Y S ^a   Richter, W ^b   Esser, N ^c   Siebentritt, S ^d   Lux Steiner, M Ch ^d  

^a NATIONAL TECHNICAL UNIVERSITY OF ATHENS   (Greece)

^b TECHNISCHE UNIVERSITÄT BERLIN   (Germany)

^c ISAS INSTITUTE FOR ANALYTICAL SCIENCES   (Germany)

^d HAHN MEITNER INSTITUT   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CHARGE COUPLED DEVICES; METALLORGANIC CHEMICAL VAPOR DEPOSITION; MICROSTRUCTURE; PHASE DIAGRAMS; PHOTOLUMINESCENCE; POLARIZATION; RAMAN SPECTROSCOPY; SCANNING ELECTRON MICROSCOPY; SEMICONDUCTOR MATERIALS; SOLAR CELLS; THIN FILMS; X RAY DIFFRACTION;

ENERGY CONVERSION EFFICIENCIES; FULL WIDTH AT HALF MAXIMUM (FWHM); RAMAN BANDS;

COPPER COMPOUNDS;

EID: 4344569290     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1772885     Document Type: Article

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