Analysis of Langmuir probe data using wavelet transform

IEEE Transactions on Plasma Science

Volumn 32, Issue 2 I, 2004, Pages 355-361

  Park, Bong Kyoung ^a   Kim, Dai Gyoung ^b   Kim, Gon Ho ^c  

^a Samsung SDI   (South Korea)

^b Hanyang University   (South Korea)

^c Seoul National University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

BIORTHOGONAL WAVELET TRANSFORMS; DAUBECHIES WAVELET TRANSFORMS; ELECTRON SATURATION CURRENT; ELECTRON TEMPERATURE; LANGMUIR PROBE; PLASMA POTENTIAL;

ALGORITHMS; COMPUTER AIDED ANALYSIS; DATA REDUCTION; ELECTRIC CURRENTS; ELECTRONS; IONS; MAGNETIZATION; PLASMA DENSITY; PLASMA DIAGNOSTICS; SIGNAL FILTERING AND PREDICTION; TEMPERATURE; WAVELET TRANSFORMS;

PLASMA PROBES;

EID: 4344568115     PISSN: 00933813     EISSN: None     Source Type: Journal    
DOI: 10.1109/TPS.2004.828123     Document Type: Article

References (7)

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3. S. Haykin and B. Van Veen, Signals and Systems. New York: Wiley, 1999, pp. 155-255.
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5. S. Mallat, A Wavelet Tour of Signal Processing, 2nd ed. New York: Academic, 1999.
6. D. Donoho, I. Johnstone, G. Kerkyacharian, and D. Picard, J. Roy. Stat. Soc., vol. 57, ser. B, p. 301, 1995.
7. B. K. Park, G. H. Kim, D. G. Kim, and T. Lho, "Determination of plasma potential from the Langmuir probe trace using bi-orthogonal wavelet transform," J. Korean Phys. Soc., vol. 42, pp. s867-s872,