Advantage of thin-film filter for reliable photoemission spectroscopy using high-flux discharging lamp

Japanese Journal of Applied Physics, Part 1: Regular Papers and Short Notes and Review Papers

Volumn 43, Issue 6 A, 2004, Pages 3618-3619

  Yokoya, Takayoshi ^a,d   Tsuda, Shunsuke ^a   Kiss, Takayuki ^a   Shin, Shik ^a,b   Mochiku, Takashi ^c   Hirata, Kazuto ^c  

^a UNIVERSITY OF TOKYO   (Japan)

^b INST OF PHYS AND CHEMICAL RESEARCH   (Japan)

^c NATIONAL INSTITUTE FOR MATERIALS SCIENCE   (Japan)

^d JAPAN SYNCHROTRON RADIATION RESEARCH INSTITUTE   (Japan)

Author keywords

Aluminum thin film filter; Angle resolved photoemission spectroscop; Degradation free; Discharging lamp

Indexed keywords

ALUMINUM; BINDING ENERGY; DEGRADATION; DISCHARGE LAMPS; MAGNETIC FLUX; MICROWAVES; OPTICAL FILTERS; OXIDATION; RESONANCE; SYNCHROCYCLOTRONS; THIN FILMS; ULTRAVIOLET RADIATION;

ANGLE-RESOLVED PHOTOEMISSION SPECTROSCOPY; GRATING CHAMBERS; HIGH-FLUX DISCHARGING LAMPS; THIN-FILM FILTERS;

PHOTOELECTRON SPECTROSCOPY;

EID: 4344566295     PISSN: 00214922     EISSN: None     Source Type: Journal    
DOI: 10.1143/JJAP.43.3618     Document Type: Article

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