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Volumn 2, Issue , 2004, Pages

A leakage estimation and reduction technique for scaled CMOS logic circuits considering gate-leakage

Author keywords

[No Author keywords available]

Indexed keywords

LEAKAGE ESTIMATION; LEAKAGE POWER REDUCTION; MINIMUM LEAKAGE VECTOR (MLV);

EID: 4344565875     PISSN: 02714310     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper
Times cited : (23)

References (8)
  • 1
    • 0042090415 scopus 로고    scopus 로고
    • Accurate estimation of total leakage current in scaled CMOS logic circuits based on compact current modeling
    • June
    • S. Mukhopadhyay, A. Raychowdhury, and K. Roy, 'Accurate Estimation of Total Leakage Current in Scaled CMOS Logic Circuits Based on Compact Current Modeling,' In Proc. DAC, pp. 169-174, June 2003.
    • (2003) Proc. DAC , pp. 169-174
    • Mukhopadhyay, S.1    Raychowdhury, A.2    Roy, K.3
  • 2
    • 0034453479 scopus 로고    scopus 로고
    • BSIM4 Gate Leakage Model Including Source Drain Partition
    • K. Cao, et. al. 'BSIM4 Gate Leakage Model Including Source Drain Partition,' IEDM, pp. 815-818, 2000.
    • (2000) IEDM , pp. 815-818
    • Cao, K.1
  • 3
    • 0023542548 scopus 로고
    • The impact of gate-induced drain leakage current on MOSFET scaling
    • T. Y. Chen, J. Chen, P. K. Ko, C. Hu, "The Impact of Gate-induced Drain Leakage Current on MOSFET Scaling,' Tech. Digest of IEDM, pp. 718-721, 1987.
    • (1987) Tech. Digest of IEDM , pp. 718-721
    • Chen, T.Y.1    Chen, J.2    Ko, P.K.3    Hu, C.4
  • 4
    • 0041589378 scopus 로고    scopus 로고
    • Analysis and minimization techniques for total leakage considering gate oxide leakage
    • June
    • D. Lee, W. Kwong, D. Blaauw, and D. Sylvester, 'Analysis and Minimization Techniques for Total Leakage Considering Gate Oxide Leakage,' In Proc. DAC, pp. 175-180, June 2003.
    • (2003) Proc. DAC , pp. 175-180
    • Lee, D.1    Kwong, W.2    Blaauw, D.3    Sylvester, D.4
  • 5
    • 1542359168 scopus 로고    scopus 로고
    • Efficient techniques for gate leakage estimation
    • August
    • R.M. Rao, J.L. Burns, A. Devgan and R.B. Brown, 'Efficient Techniques for Gate Leakage Estimation,' In Proc. ISLPED, pp. 100-103, August 2003.
    • (2003) Proc. ISLPED , pp. 100-103
    • Rao, R.M.1    Burns, J.L.2    Devgan, A.3    Brown, R.B.4
  • 7
    • 0031635212 scopus 로고    scopus 로고
    • A new technique for standby leakage reduction in high-performance circuits
    • Y. Ye, S. Borker, and V. De, 'A New Technique for Standby Leakage Reduction in High-Performance Circuits,' Symposium on VLSI Circuits, pp. 40-41.9, 1998.
    • (1998) Symposium on VLSI Circuits
    • Ye, Y.1    Borker, S.2    De, V.3
  • 8
    • 0036949134 scopus 로고    scopus 로고
    • Runtime mechanisms for leakage current reduction in CMOS VLSI circuits
    • Aug.
    • A. Abdollahi, F. Fallah, and M. Pedram, 'Runtime Mechanisms for Leakage Current Reduction in CMOS VLSI Circuits,' In Proc. ISLPED, pp. 213-218, Aug. 2002.
    • (2002) Proc. ISLPED , pp. 213-218
    • Abdollahi, A.1    Fallah, F.2    Pedram, M.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.