The effect of residual stresses in the ZnO buffer layer on the density of a ZnO nanowire array

Nanotechnology

Volumn 19, Issue 22, 2008, Pages

  Liao, Xing ^a,b   Zhang, X ^a,b   Li, Su ^a,b  

^a TSINGHUA UNIVERSITY   (China)

^b Beijing National Center for Electron Microscopy   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ANNEALING; DENSITY CONTROL (SPECIFIC GRAVITY); MICROCRACKS; RESIDUAL STRESSES; THIN FILMS; ZINC OXIDE;

ANNEALED THIN FILMS; INHOMOGENEOUS DISTRIBUTION; NANOWIRE ARRAYS; UNANNEALED THIN FILMS;

NANOWIRES;

BUFFER; NANOWIRE; ZINC OXIDE;

ARTICLE; ATOMIC FORCE MICROSCOPY; DENSITY; FILM; HIGH RESOLUTION TRANSMISSION ELECTRON MICROSCOPY; NANOARRAY; NANOTECHNOLOGY; NONHUMAN; PRIORITY JOURNAL; SCANNING ELECTRON MICROSCOPY; SYNTHESIS; TRANSMISSION ELECTRON MICROSCOPY; X RAY DIFFRACTION;

EID: 43249129102     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/19/22/225303     Document Type: Article

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