Kinetic contrast in atomic force microscopy

Journal of Experimental and Theoretical Physics

Volumn 106, Issue 2, 2008, Pages 228-234

  Sheglov, D V ^a   Latyshev, A V ^a  

^a INSTITUTE OF SEMICONDUCTOR PHYSICS   (Russian Federation)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER; IMAGE ANALYSIS; IMPURITIES; PHASE SHIFT; PHASE VELOCITY; SURFACE ROUGHNESS;

COPPER IMPURITY; FRICTION FORCE; KINETIC MECHANISM; PHASE CONTRAST;

ATOMIC FORCE MICROSCOPY;

EID: 43249106544     PISSN: 10637761     EISSN: None     Source Type: Journal    
DOI: 10.1134/s1063776108020039     Document Type: Article

References (28)