Sodium hypochlorite as dentin pretreatment for etch-and-rinse single-bottle and two-step self-etching adhesives: Atomic force microscope and tensile bond strength evaluation

Journal of Adhesive Dentistry

Volumn 10, Issue 2, 2008, Pages 135-144

  Fawzy, Amr S ^a   Amer, Mohamed A ^b   El Askary, Farid S ^a  

^a Ain Shams University   (Egypt)

^b NATIONAL INSTITUTE FOR STANDARDS   (Egypt)

Author keywords

AFM; Dentin adhesives; Sodium hypochlorite; Tensile bond strength

Indexed keywords

ACRYLIC ACID RESIN; ADHESE CEMENT; DENTIN BONDING AGENT; EXCITE CEMENT; HYPOCHLORITE SODIUM; INORGANIC COMPOUND; METHACRYLIC ACID DERIVATIVE; OXIDIZING AGENT; PHOSPHORIC ACID; RESIN; RESIN CEMENT; SILICON CARBIDE; SILICON DERIVATIVE; TETRIC CERAM;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; COMPARATIVE STUDY; DENTAL ACID ETCHING; DENTAL BONDING; DENTAL SURGERY; DENTIN; HUMAN; MATERIALS TESTING; MECHANICAL STRESS; METHODOLOGY; PHOTOGRAPHY; SCANNING ELECTRON MICROSCOPY; SURFACE PROPERTY; TENSILE STRENGTH; TIME; ULTRASTRUCTURE;

ACID ETCHING, DENTAL; ACRYLIC RESINS; CARBON COMPOUNDS, INORGANIC; COMPOSITE RESINS; DENTAL BONDING; DENTIN; DENTIN-BONDING AGENTS; HUMANS; MATERIALS TESTING; METHACRYLATES; MICROSCOPY, ATOMIC FORCE; MICROSCOPY, ELECTRON, SCANNING; OXIDANTS; PHOSPHORIC ACIDS; PHOTOGRAPHY; RESIN CEMENTS; SILICON COMPOUNDS; SMEAR LAYER; SODIUM HYPOCHLORITE; STRESS, MECHANICAL; SURFACE PROPERTIES; TENSILE STRENGTH; TIME FACTORS;

EID: 43149105600     PISSN: 14615185     EISSN: 17579988     Source Type: Journal    
DOI: 10.3290/j.jad.a13332     Document Type: Article

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