Consistent estimation of rasch item parameters and their standard errors under complex sample designs

Applied Psychological Measurement

Volumn 32, Issue 4, 2008, Pages 289-310

  Cohen, Jon ^a,b   Chan, Tsze ^a   Jiang, Tao ^a   Seburn, Mary ^a  

^a American Institutes for Research

^b AMERICAN INSTITUTES FOR RESEARCH   (United States)

Author keywords

Equating; Item response theory; Nonparametric marginal maximum likelihood; Rasch model; Standard error

Indexed keywords

EID: 43149101480     PISSN: 01466216     EISSN: 15523497     Source Type: Journal    
DOI: 10.1177/0146621607300047     Document Type: Article

References (28)