Preparation of nanosize polyaniline and its utilization for microwave absorber

Journal of Nanoscience and Nanotechnology

Volumn 7, Issue 6, 2007, Pages 2129-2133

  Abbas, S M ^a,b   Dixit, A K ^b   Chatterjee, R ^a   Goel, T C ^c  

^a INDIAN INSTITUTE OF TECHNOLOGY DELHI   (India)

^b DEFENCE MATERIALS AND STORES RESEARCH AND DEVELOPMENT ESTABLISHMENT   (India)

^c BIRLA INSTITUTE OF TECHNOLOGY AND SCIENCE   (India)

Author keywords

EMI shielding; Microwave absorber; Polyaniline; Reflection loss

Indexed keywords

AGILENT (CO); CENTRAL FREQUENCY (CF); COMPLEX PERMEABILITY; COMPLEX PERMITTIVITY (CP); DIFFERENT FREQUENCIES; ELECTRO-MAGNETIC INTERFERENCE (EMI); MEASURED VALUES; MICROWAVE ABSORBERS; NANO SIZES; NETWORK ANALYZER; PLANE WAVES; POLYURETHANE (PU); POWER ABSORPTION; RADAR SIGNATURES; REFLECTION LOSSES; SAMPLE THICKNESS; SOFTWARE MODULES; STEALTH TECHNOLOGY;

ABSORPTION; CARBON FIBER REINFORCED PLASTICS; ELECTRIC NETWORK ANALYSIS; ELECTROMAGNETIC COMPATIBILITY; ELECTROMAGNETIC PULSE; FOURIER TRANSFORM INFRARED SPECTROSCOPY; MIXING; PERMITTIVITY; POLYMERS; POWDERS; REFLECTION; X RAY ANALYSIS; X RAY DIFFRACTION ANALYSIS;

TRANSIENT ANALYSIS;

EID: 43049169550     PISSN: 15334880     EISSN: None     Source Type: Journal    
DOI: 10.1166/jnn.2007.782     Document Type: Conference Paper

References (18)

1. A. N. Yusoff, M. H. Abdulla, S. H. Ahmad, S. F. Jusoh, A. A. Mansor, and S. A. A. Hamid, J. Appl. Phys. 92, 876 (2002).
2. C. H. Peng, C. C. Hwang, J. Wan, J. S. Tsai, and S. Y. Chem, Mater. Sci. Eng. B 117, 27 (2005).
3. D. D. L. Chung, Carbon 39, 279 (2001).
4. R. A. Stonier, SAMPE J. 27, 9 (1991).
5. S. W. Phang, R. Daik, and M. H. Abdullah, Thin Solid Films 477, 125 (2005).
6. S. Courric and V. H. Tran, Polymer 39, 2399 (1998).
7. S. Koul, R. Chandra, and S. K. Dhawan, Polymer 41, 9305 (2000).
8. L. Olmedo, P. Hourquebie, and F. Jousse, Handbook of Organic Conductive Molecules and Polymers, edited by H. S. Nalwa, John Wiley and Sons (1997), Vol. 3, p. 367.
9. S. M. Abbas, A. K. Dixit, R. Chatterjee, and T. C. Goel, Mater Sci. Eng. B 123, 167 (2005).
10. M. R. Meshram, N. K. Agarwal, B. Sinha, and P. S. Misra, J. Magn. Magn Mater. 271, 207 (2004).
11. Y. Naito and K. Suetake, IEEE Trans. Micro. Theo. Technol. 19, 65 (1971).
12. S. M. Abbas, M. Chandra, A. Verma, R. Chatterjee, and T. C. Goel, Composites-A (2005), on line in press.
13. Hewlett-Packard Microwave Network Analyser catalogue 8510 and product note 8510-3 (1987).
14. E. Ruckenstain and S. Yang, Syn. Meter. 53, 283 (1993).
15. W. Luzny, M. Sniechowski, and J. Laska, Syn. Meter. 126, 27 (2002).
16. Brika and W. Luzny, Syn. Meter. 101, 715 (1999).
17. P. Chandrasekhar and K. Naishadham, Syn. Meter. 105, 115 (1999).
18. V. B. Bregar, IEEE Tans. Magn. 40, 1679 (2004).