Thermally induced changes in thin gold films detected by polaritonic ellipsometry

Materials Science and Engineering: B

Volumn 149, Issue 3, 2008, Pages 285-291

  Romanyuk, V R ^a   Kondratenko, O S ^a   Fursenko, O V ^a   Lytvyn, O S ^a   Zynyo, S A ^a   Korchovyi, A A ^a   Dmitruk, N L ^a  

^a INSTITUTE OF HYDROBIOLOGY   (Ukraine)

Author keywords

Annealing; Gold; Optical properties; Polaritonic ellipsometry; Recrystallization; Surface morphology

Indexed keywords

ANNEALING; ATOMIC FORCE MICROSCOPY; ELLIPSOMETRY; METALLIC FILMS; REFLECTION; SURFACE MORPHOLOGY; WAVELENGTH;

FILM MICRORELIEF; FILM MICROSTRUCTURE; OPTOCHEMICAL SENSORS; REFLECTANCE ELLIPSOMETRY; VACUUM HEAT TREATMENT;

THIN FILMS;

EID: 43049150118     PISSN: 09215107     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.mseb.2007.10.019     Document Type: Article

References (31)