Ionization interference in inductively coupled plasma-optical emission spectroscopy

SEI Technical Review

Volumn , Issue 66, 2008, Pages 106-111

  Morishige, Yosuke ^a   Kimura, Atsushi ^a  

^a Analysis Technology Research Center

Author keywords

[No Author keywords available]

Indexed keywords

HIGH PRECISION ELEMENTAL ANALYSIS; IONIZATION INTERFERENCE;

CESIUM; ENVIRONMENTAL ENGINEERING; IONIZATION POTENTIAL; MATERIALS TESTING; MEASUREMENT ERRORS;

INDUCTIVELY COUPLED PLASMA MASS SPECTROMETRY;

EID: 43049122813     PISSN: 13434349     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (5)