Determination of buried interface composition and magnetism profiles using standing-wave excited soft x-ray emission and inelastic scattering

Journal of Applied Physics

Volumn 103, Issue 8, 2008, Pages

  Sell, B C ^a,b,c   Ritchey, S B ^a,b,c   Yang, S H ^d   Parkin, S S P ^d   Watanabe, M ^b,e   Mun, B S ^f   Plucinski, L ^b,h   Mannella, N ^a,b   Nambu, A ^g,i   Guo, J ^b   West, M W ^b   Salmassi, F ^b   Kortright, J B ^b   Fadley, C S ^a,b,g  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^c OTTERBEIN UNIVERSITY   (United States)

^d IBM ALMADEN RESEARCH CENTER   (United States)

^e RIKEN HARIMA INSTITUTE   (Japan)

^f Hanyang University   (South Korea)

^g FORSCHUNGSZENTRUM JÜLICH   (Germany)

^h STANFORD UNIVERSITY   (United States)

ⁱ BROOKHAVEN NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

INELASTIC SCATTERING; IRON COMPOUNDS; MAGNETISM; MAGNETORESISTANCE; X RAY SCATTERING; X RAY SPECTROSCOPY;

FE INTERFACES; INTERFACE COMPOSITION; MAGNETIC CIRCULAR DICHROISM; X RAY EMISSION;

STANDING WAVE METERS;

EID: 43049119322     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2906331     Document Type: Article

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