-
1
-
-
0021385595
-
-
P.J. Webster, K.R.A. Ziebeck, S.L. Town, M.S. Peak, Phil. Mag. B 49, 295 (1984)
-
(1984)
Phil. Mag. B
, vol.49
, pp. 295
-
-
Webster, P.J.1
Ziebeck, K.R.A.2
Town, S.L.3
Peak, M.S.4
-
3
-
-
0000147935
-
-
A. Zheludev, S.M. Shapiro, P. Wochner, A. Schwartz, M. Wall, L.E. Tanner, Phys. Rev. B 51, 11310 (1995)
-
(1995)
Phys. Rev. B
, vol.51
, pp. 11310
-
-
Zheludev, A.1
Shapiro, S.M.2
Wochner, P.3
Schwartz, A.4
Wall, M.5
Tanner, L.E.6
-
4
-
-
0001420308
-
-
A. Planes, E. Obradó, A. González-Comas, L. Manõsa, Phys. Rev. Lett. 79, 3926 (1997)
-
(1997)
Phys. Rev. Lett.
, vol.79
, pp. 3926
-
-
Planes, A.1
Obradó, E.2
González-Comas, A.3
Manõsa, L.4
-
6
-
-
0034228403
-
-
J. Pons, V.A. Chernenko, R. Santamarta, E. Cesari, Acta Mater. 48, 3027 (2000)
-
(2000)
Acta Mater.
, vol.48
, pp. 3027
-
-
Pons, J.1
Chernenko, V.A.2
Santamarta, R.3
Cesari, E.4
-
7
-
-
0037020953
-
-
P.J. Brown, J. Crangle, T. Kanomata, M. Matsumoto, K.U. Neumann, B. Ouladdiaf, K.R.A. Ziebeck, J. Phys.: Condens. Matter 14, 10159 (2002)
-
(2002)
J. Phys.: Condens. Matter
, vol.14
, pp. 10159
-
-
Brown, P.J.1
Crangle, J.2
Kanomata, T.3
Matsumoto, M.4
Neumann, K.U.5
Ouladdiaf, B.6
Ziebeck, K.R.A.7
-
8
-
-
0000903033
-
-
A. Zheludev, S.M. Shapiro, P. Wochner, L.E. Tanner, Phys. Rev. B 54, 15045 (1996)
-
(1996)
Phys. Rev. B
, vol.54
, pp. 15045
-
-
Zheludev, A.1
Shapiro, S.M.2
Wochner, P.3
Tanner, L.E.4
-
9
-
-
33748521249
-
-
L. Righi, F. Albertini, G. Calestani, L. Pareti, A. Paoluzi, C. Ritter, P.A. Algarabel, L. Morellon, M.R. Ibarra, J. Sol. Stat. Chem. 179, 3525 (2006)
-
(2006)
J. Sol. Stat. Chem.
, vol.179
, pp. 3525
-
-
Righi, L.1
Albertini, F.2
Calestani, G.3
Pareti, L.4
Paoluzi, A.5
Ritter, C.6
Algarabel, P.A.7
Morellon, L.8
Ibarra, M.R.9
-
10
-
-
0038721203
-
-
edited by J.R. Weertman, M. Fine, K. Fabor, W. King, P. Liaw (TMS)
-
K. Tsuchiya, K. Yamamoto, T. Hirayama, H. Nakayama, Y. Todaka, M. Umemoto, Electron Microscopy: Its Role in Materials Science, edited by J.R. Weertman, M. Fine, K. Fabor, W. King, P. Liaw (TMS, 2003), pp. 305-312
-
(2003)
Electron Microscopy: Its Role in Materials Science
, pp. 305-312
-
-
Tsuchiya, K.1
Yamamoto, K.2
Hirayama, T.3
Nakayama, H.4
Todaka, Y.5
Umemoto, M.6
-
13
-
-
0027694675
-
-
K. Otsuka, T. Ohba, M. Tokonami, C.M. Wayman, Scr. Metall. Mater. 29, 1359 (1993)
-
(1993)
Scr. Metall. Mater.
, vol.29
, pp. 1359
-
-
Otsuka, K.1
Ohba, T.2
Tokonami, M.3
Wayman, C.M.4
|