Mechanical properties of SiC nanowires determined by scanning electron and field emission microscopies

Physical Review B - Condensed Matter and Materials Physics

Volumn 77, Issue 16, 2008, Pages

  Perisanu, S ^a   Gouttenoire, V ^a   Vincent, P ^a   Ayari, A ^a   Choueib, M ^a,b   Bechelany, M ^b   Cornu, D ^b   Purcell, S T ^a  

^a UNIVERSITÉ LYON 1   (France)

^b UNIVERSITÉ CLAUDE BERNARD LYON 1   (France)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 43049114547     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.77.165434     Document Type: Article

References (42)