Geometrical, electrical and stability properties of thick-film and LTCC microcapacitors

Microelectronics International

Volumn 25, Issue 2, 2008, Pages 37-41

  Miś, Edward ^a   Dziedzic, Andrzej ^a   Piasecki, Tomasz ^a   Kita, Jarosław ^b   Moos, Ralf ^b  

^a WROCLAW UNIVERSITY OF TECHNOLOGY   (Poland)

^b UNIVERSITY OF BAYREUTH   (Germany)

Author keywords

Capacitors; Electronic engineering; Films (states of matter)

Indexed keywords

EID: 43049109217     PISSN: 13565362     EISSN: None     Source Type: Journal    
DOI: 10.1108/13565360810875994     Document Type: Article

References (6)