Re-entrant type relaxor behavior in (1-x) BaTiO3 -xBiScO 3 solid solution

Applied Physics Letters

Volumn 92, Issue 17, 2008, Pages

  Guo, Hai Yan ^a   Lei, Chao ^a   Ye, Zuo Guang ^a  

^a SIMON FRASER UNIVERSITY   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGE ANALYSIS; PHASE TRANSITIONS; RELAXATION PROCESSES; SYNTHESIS (CHEMICAL);

DIELECTRIC ANOMALY; IMPEDANCE SPECTROSCOPY; VOGEL-FULCHER LAW;

SOLID SOLUTIONS;

EID: 43049106820     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2913208     Document Type: Article

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