Textural features based universal steganalysis

Proceedings of SPIE - The International Society for Optical Engineering

Volumn 6819, Issue , 2008, Pages

  Li, Bin ^a,b   Huang, Jiwu ^a   Shi, Yun Q ^b  

^a SUN YAT SEN UNIVERSITY   (China)

^b NEW JERSEY INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

Local linear transform; Steganalysis; Steganography; Texture classification

Indexed keywords

ALGORITHMS; FEATURE EXTRACTION; IMAGE CLASSIFICATION; PROBLEM SOLVING;

LOCAL LINEAR TRANSFORMS; STEGANALYSIS; STEGANOGRAPHY; TEXTURE CLASSIFICATION;

IMAGE ANALYSIS;

EID: 42949179512     PISSN: 0277786X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1117/12.765817     Document Type: Conference Paper

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