Systematically creased thin-film membrane structures

Journal of Spacecraft and Rockets

Volumn 45, Issue 1, 2008, Pages 10-18

  Papa, Alessandro ^a,b   Pellegrino, Sergio ^a,b,c  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^b Department of Engineering ^*

^c California Institute of Technology   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELASTICITY; PARAMETER ESTIMATION; RANDOM PROCESSES; STRESS CONCENTRATION;

STRESS MAGNITUDES; THIN FILM MEMBRANE;

THIN FILMS;

EID: 42949149104     PISSN: 00224650     EISSN: 15336794     Source Type: Journal    
DOI: 10.2514/1.18285     Document Type: Conference Paper

References (10)