A charge coupled device camera with electron decelerator for intermediate voltage electron microscopy

Review of Scientific Instruments

Volumn 79, Issue 4, 2008, Pages

  Downing, Kenneth H ^a   Mooney, Paul E ^b  

^a LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^b GATAN INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON DECELERATORS; HIGH-RESOLUTION ELECTRON CRYSTALLOGRAPHY; INTERMEDIATE VOLTAGE ELECTRON MICROSCOPES (IVEM);

DATA RECORDING; ELECTRON MICROSCOPY; SIGNAL ANALYSIS; VOLTAGE MEASUREMENT;

CCD CAMERAS;

ARTICLE; CRYSTALLOGRAPHY; ELECTRON; ELECTRON MICROSCOPY; EQUIPMENT; EQUIPMENT DESIGN; IMAGE ENHANCEMENT; INSTRUMENTATION; METHODOLOGY; SIGNAL PROCESSING;

CRYSTALLOGRAPHY; ELECTRONS; EQUIPMENT DESIGN; EQUIPMENT FAILURE ANALYSIS; IMAGE ENHANCEMENT; MICROSCOPY, ELECTRON; SIGNAL PROCESSING, COMPUTER-ASSISTED;

EID: 42949130733     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2902853     Document Type: Article

References (20)