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Volumn 79, Issue 4, 2008, Pages

Angle-resolving time-of-flight electron spectrometer for near-threshold precision measurements of differential cross sections of electron-impact excitation of atoms and molecules

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC EXCITATION; ELECTRON BEAMS; MEASUREMENT THEORY; MOLECULAR STRUCTURE; SPECTROMETERS;

EID: 42949130218     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2912824     Document Type: Article
Times cited : (6)

References (18)
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.