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Volumn 79, Issue 4, 2008, Pages
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Angle-resolving time-of-flight electron spectrometer for near-threshold precision measurements of differential cross sections of electron-impact excitation of atoms and molecules
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRIC EXCITATION;
ELECTRON BEAMS;
MEASUREMENT THEORY;
MOLECULAR STRUCTURE;
SPECTROMETERS;
PULSED ELECTRON BEAM;
SCATTERING CHANNELS;
TIME-OF-FLIGHT ELECTRON SPECTROMETER;
ATOMS;
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EID: 42949130218
PISSN: 00346748
EISSN: None
Source Type: Journal
DOI: 10.1063/1.2912824 Document Type: Article |
Times cited : (6)
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References (18)
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