An ultrahigh vacuum system for in situ studies of thin films and nanostructures by nuclear resonance scattering of synchrotron radiation

Review of Scientific Instruments

Volumn 79, Issue 4, 2008, Pages

  Stankov, Svetoslav ^a   Rüffer, Rudolf ^a   Sladecek, Marcel ^b,e   Rennhofer, Marcus ^b   Sepiol, Bogdan ^b   Vogl, Gero ^b   Spiridis, Nika ^c   Slezak, Tomasz ^c,d   Korecki, Jozef ^c,d  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b UNIVERSITY OF VIENNA   (Austria)

^c INSTITUTE OF CATALYSIS AND SURFACE CHEMISTRY   (Poland)

^d AGH UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Poland)

^e PHILIPS RESEARCH LABORATORIES   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

LOW ENERGY ELECTRON DIFFRACTION; MAGNETIC PROPERTIES; NANOSTRUCTURES; NUCLEAR MAGNETIC RESONANCE; STOICHIOMETRY; SYNCHROTRON RADIATION;

EUROPEAN SYNCHROTRON RADIATION FACILITY (ESRF); NUCLEAR RESONANCE SCATTERING; ULTRAHIGH VACUUM SYSTEM;

THIN FILMS;

EID: 42949096544     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2906321     Document Type: Article

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