Invited review article: Microwave spectroscopy based on scanning thermal microscopy: Resolution in the nanometer range

Review of Scientific Instruments

Volumn 79, Issue 4, 2008, Pages

  Meckenstock, Ralf ^a  

^a UNIVERSITY OF DUISBURG ESSEN   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

MICROWAVE SPECTROSCOPY; NANOSTRUCTURES; THERMAL EFFECTS; THERMOELASTICITY;

SCANNING THERMAL MICROSCOPE-DETECTED FERROMAGNETIC RESONANCE (STHM-FMR); SCANNING THERMOELASTIC MICROSCOPE; THERMAL NANOPROBE;

FERROMAGNETIC RESONANCE;

EID: 42949090467     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2908445     Document Type: Review

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