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Volumn 87, Issue 15, 2001, Pages

Probing interface electronic structure with overlayer quantum-well resonances: Al/Si(111)

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM; BAND STRUCTURE; ELECTRON EMISSION; ELECTRON MICROSCOPY; ELECTRON RESONANCE; ELECTRONIC STRUCTURE; ENERGY GAP; GROUND STATE; INTERFACES (MATERIALS); PHOTOELECTRON SPECTROSCOPY; PROBES; SEMICONDUCTING SILICON;

EID: 42749107799     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article
Times cited : (97)

References (17)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.