Roughness of stylolites: Implications of 3D high resolution topography measurements

Physical Review Letters

Volumn 93, Issue 23, 2004, Pages

  Schmittbuhl, J ^a   Renard, F ^b,c   Gratier, J P ^b   Toussaint, R ^c  

^a LABORATOIRE DE GÉOLOGIE   (France)

^b UNIVERSITÉ GRENOBLE ALPES   (France)

^c UNIVERSITY OF OSLO   (Norway)

Author keywords

[No Author keywords available]

Indexed keywords

APPROXIMATION THEORY; DEFORMATION; GRAIN SIZE AND SHAPE; GROWTH (MATERIALS); INTERFACES (MATERIALS); LASER BEAMS; STRAIN; SURFACE ROUGHNESS; SURFACE TENSION; TOPOLOGY;

COMPLEX ROUGHNESS; LANGEVIN EQUATIONS; STYLOLITES; TOPOGRAPHY MEASUREMENTS;

SEDIMENTARY ROCKS;

EID: 42749104565     PISSN: 00319007     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevLett.93.238501     Document Type: Article

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