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Volumn 69, Issue 3 1, 2004, Pages

Chaos-induced modulation of reliability boosts output firing rate in downstream cortical areas

Author keywords

[No Author keywords available]

Indexed keywords

CHAOS THEORY; DATA PROCESSING; ELECTRIC CURRENTS; JITTER; NEURAL NETWORKS; PHASE LOCKED LOOPS; POLARIZATION; STATISTICAL METHODS;

EID: 42749104231     PISSN: 1063651X     EISSN: None     Source Type: Journal    
DOI: 10.1103/PhysRevE.69.031912     Document Type: Article
Times cited : (16)

References (68)
  • 68
    • 33645071405 scopus 로고    scopus 로고
    • We used the FORTRAN code provided by J. D. Victor on the web page http://www-users.med.cornell.edu/~ jdvicto/metricdf.html to calculate the metrics.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.