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Physical Review Letters

Volumn 87, Issue 14, 2001, Pages

In situ X-ray absorption fine structure detection of reversible photoinduced anisotropy in amorphous selenium

(3) Kolobov, A V a Oyanagi, H b Tanaka, K c

a NATL INST FOR ADV INTERDISC RES (Japan)

b ELECTROTECHNICAL LABORATORY (Japan)

c JT RES CENTER FOR ATOM TECHNOLOGY (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION SPECTROSCOPY; AMORPHOUS MATERIALS; BAND STRUCTURE; CHEMICAL BONDS; CRYSTALLIZATION; CURVE FITTING; LASER BEAMS; LIGHT ABSORPTION; LIGHT POLARIZATION; MOLECULAR ORIENTATION; THIN FILMS; X RAY SPECTROSCOPY;

AMORPHOUS SELENIUM; ARGON-ION LASER; CHAIN ORIENTATION; LINEARLY POLARIZED LIGHT; OPTICAL ANISOTROPY; OPTICALLY CONTROLLED REORIENTATION; PHOTOINDUCED ANISOTROPIC CRYSTALLIZATION; X-RAY ABSORPTION FINE STRUCTURE SPECTROSCOPY;

SELENIUM;

EID: 42749101428 PISSN: 00319007 EISSN: None Source Type: Journal
DOI: 10.1103/PhysRevLett.87.145502 Document Type: Article

Times cited : (28)

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