SCOPUS 정보 검색 플랫폼

ECS Transactions

Volumn 6, Issue 19, 2007, Pages 1-10

Nanotopography development on silicon electrodes by analysis of brewster angle real-time spectroscopy

(2) Lublow, M a Lewerenz, H J a

a HAHN MEITNER INSTITUT (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

ASPECT RATIO; ATOMIC FORCE MICROSCOPY; DISSOLUTION; FLUORINE COMPOUNDS; NANOSTRUCTURES;

AUTOCORRELATION ANALYSIS; CONSTANT POTENTIAL; NANOSTRUCTURE FORMATION; OPEN CIRCUIT POTENTIAL; REAL-TIME SPECTROSCOPY; SILICON DISSOLUTION; SILICON ELECTRODE; STRUCTURE ALIGNMENT;

SILICON COMPOUNDS;

EID: 42649133168 PISSN: 19385862 EISSN: 19386737 Source Type: Conference Proceeding
DOI: 10.1149/1.2831725 Document Type: Conference Paper

Times cited : (4)

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