SCOPUS 정보 검색 플랫폼

Volumn 254, Issue 14, 2008, Pages 4303-4307

Structural investigations of TiO2:Tb thin films by X-ray diffraction and atomic force microscopy

Author keywords

AFM; Sputtering; Terbium; Thin film; TiO2

Indexed keywords

ATOMIC FORCE MICROSCOPY; CRYSTALLITES; MAGNETRON SPUTTERING; MICROSTRUCTURE; TERBIUM COMPOUNDS; THIN FILMS; X RAY DIFFRACTION ANALYSIS;

ANNEALING TREATMENT; RUTILE FORMS;

TITANIUM DIOXIDE;

EID: 42649109686 PISSN: 01694332 EISSN: None Source Type: Journal
DOI: 10.1016/j.apsusc.2008.01.018 Document Type: Article

Times cited : (18)

References (15)

1
- 0038061924
- K.L. Frindell M.H. Bartl M.R. Robinson G.C. Bazan A. Popitsch G.D. Stucky J. Solid State Chem. 172 2003 81
- (2003) J. Solid State Chem. , vol.172 , pp. 81
- Frindell, K.L.¹ Bartl, M.H.² Robinson, M.R.³ Bazan, G.C.⁴ Popitsch, A.⁵ Stucky, G.D.⁶

2
- 32644464459
- Q.G. Zeng Z.J. Ding Z.M. Zhang J. Lumin. 118 2006 301
- (2006) J. Lumin. , vol.118 , pp. 301
- Zeng, Q.G.¹ Ding, Z.J.² Zhang, Z.M.³

3
- 28044444582
- Ch. Jia E. Xie A. Peng R. Jiang F. Ye H. Lin T. Xu Thin Solid Films 496 2006 555
- (2006) Thin Solid Films , vol.496 , pp. 555
- Jia, Ch.¹ Xie, E.² Peng, A.³ Jiang, R.⁴ Ye, F.⁵ Lin, H.⁶ Xu, T.⁷

4
- 33644978126
- B.K. Moon J.H. Jeong S. Yi S.C. Kim H. Choi J.H. Kim Opt. Mater. 28 2006 676
- (2006) Opt. Mater. , vol.28 , pp. 676
- Moon, B.K.¹ Jeong, J.H.² Yi, S.³ Kim, S.C.⁴ Choi, H.⁵ Kim, J.H.⁶

5
- 33845528760
- A.A. Ismail M. Abboudi P. Holloway H. El-Shall Mater. Res. Bull. 42 2007 137
- (2007) Mater. Res. Bull. , vol.42 , pp. 137
- Ismail, A.A.¹ Abboudi, M.² Holloway, P.³ El-Shall, H.⁴

6
- 85120273514
- E. Prociow, J. Domaradzki, D. Kaczmarek, T. Berlicki. Polish patent no. PL 382163.

7
- 33746970960
- J. Domaradzki D. Kaczmarek E.L. Prociow A. Borkowska D. Schmeisser G. Beuckert Thin Solid Films 513 2006 269
- (2006) Thin Solid Films , vol.513 , pp. 269
- Domaradzki, J.¹ Kaczmarek, D.² Prociow, E.L.³ Borkowska, A.⁴ Schmeisser, D.⁵ Beuckert, G.⁶

9
- 0345171060
- Y.S. Jung D.W. Lee D.Y. Jeon Appl. Surf. Sci. 221 2004 136
- (2004) Appl. Surf. Sci. , vol.221 , pp. 136
- Jung, Y.S.¹ Lee, D.W.² Jeon, D.Y.³

10
- 0035151541
- K. Okimura Surf. Coat. Technol. 135 2001 286
- (2001) Surf. Coat. Technol. , vol.135 , pp. 286
- Okimura, K.¹

11
- 34047109564
- I. Horcas R. Fernandez J.M. Gomez-Rodriguez J. Colchero J. Gomez-Herrero A.M. Baro Rev. Sci. Instrum. 78 2007 013705
- (2007) Rev. Sci. Instrum. , vol.78 , pp. 013705
- Horcas, I.¹ Fernandez, R.² Gomez-Rodriguez, J.M.³ Colchero, J.⁴ Gomez-Herrero, J.⁵ Baro, A.M.⁶

12
- 0003495856
- Powder Diffraction File
- Powder Diffraction File 1967 Joint Committee on Powder Diffraction Standards ASTM Philadelphia, PA Card 21-1276
- (1967)

13
- 33750938461
- B.Y. Moon J.H. Jeong S. Yi S.E. Choi P.S. Kim H. Choi J.H. Kim J. Lumin. 122/123 2007 873
- (2007) J. Lumin. , vol.122/123 , pp. 873
- Moon, B.Y.¹ Jeong, J.H.² Yi, S.³ Choi, S.E.⁴ Kim, P.S.⁵ Choi, H.⁶ Kim, J.H.⁷

14
- 34247473387
- E.L. Prociow J. Domaradzki A. Podhorodecki A. Borkowska D. Kaczmarek J. Misiewicz Thin Solid Films 515 2007 6344
- (2007) Thin Solid Films , vol.515 , pp. 6344
- Prociow, E.L.¹ Domaradzki, J.² Podhorodecki, A.³ Borkowska, A.⁴ Kaczmarek, D.⁵ Misiewicz, J.⁶

15
- 0003495856
- Powder Diffraction File
- Powder Diffraction File 1967 Joint Committee on Powder Diffraction Standards ASTM Philadelphia, PA Card 21-1272
- (1967)

* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.