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Volumn 77, Issue 15, 2008, Pages

Electronic surface error in the Si interstitial formation energy

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EID: 42649095652     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.77.155211     Document Type: Article
Times cited : (32)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.