Evolution of residual stress and crack morphologies during 3D FIB tomographic analysis of alumina

Journal of Microscopy

Volumn 230, Issue 2, 2008, Pages 240-251

  Elfallagh, F ^a   Inkson, B J ^a  

^a UNIVERSITY OF SHEFFIELD   (United Kingdom)

Author keywords

Alumina; Cr3+ fluorescence; FIB; Microindentation; Stress; Tomography

Indexed keywords

ALUMINUM OXIDE; CHROMIUM COMPOUNDS; CRACKS; CRYSTAL ORIENTATION; FLUORESCENCE; FLUORESCENCE SPECTROSCOPY; INDENTATION; ION BEAMS; RESIDUAL STRESSES; SAPPHIRE; SINGLE CRYSTALS; TOMOGRAPHY;

CR 3+; CR3+ FLUORESCENCE; CRACK MORPHOLOGY; FOCUSED ION BEAM TOMOGRAPHIES; FOCUSED IONS BEAMS; MICRO INDENTATION; MILLED SURFACES; SERIAL SECTIONING; TOMOGRAPHIC; VICKERS;

ALUMINA;

ALUMINUM OXIDE; CHROMIUM;

CONFERENCE PAPER; CRYSTAL; FLUORESCENCE SPECTROSCOPY; IMAGE QUALITY; PRIORITY JOURNAL; STRESS; THREE DIMENSIONAL IMAGING;

EID: 42649092880     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/j.1365-2818.2008.01981.x     Document Type: Conference Paper

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