Relationship between cuprum cstress corn chlorophyll concentration and corn reflectance

Liaoning Gongcheng Jishu Daxue Xuebao (Ziran Kexue Ban)/Journal of Liaoning Technical University (Natural Science Edition)

Volumn 27, Issue 1, 2008, Pages 125-128

  Liu, Shuai ^a   Gao, Yongguang ^b  

^a EAST CHINA UNIVERSITY OF TECHNOLOGY   (China)

^b The Army of 61683   (China)

Author keywords

Cu stress; Hyperspectral remote sensing; Red edge; Spectral reflectance

Indexed keywords

EID: 42549171584     PISSN: 10080562     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (9)

1. Minolta Co., Ltd.. Chlorophyll SPAD-502 Instruction Mannal[M].[S.I.] Radiometric Instrunents Operations, 1989.
2. Chinese source.
3. Chinese source.
4. Chinese source.
5. Steven M D, Clark J A. High Spectral Resolution Indices for Crop Stress[C]. Steven M D, Clark J A. Application of Remote Sensing in Agriculture. 1990.
6. Horler D. The Red Edge of Plant Led Reflectance[J]. Int J Remote Sens, 1983,4:273-278.
7. Hoder D N H, Barber J P, Ferns D C, etl. Approaches to detection of geochemical stress in vegetation [J]. Advanced Space Reasearch, 1983,3:175-179.
8. Chinese source.
9. Chinese source.